Aehr Test Systems EBITDA 2010-2024 | AEHR
Aehr Test Systems ebitda from 2010 to 2024. Ebitda can be defined as earnings before interest, taxes, depreciation and amortization.
Aehr Test Systems Annual EBITDA
(Millions of US $) |
| 2024 |
$11 |
| 2023 |
$14 |
| 2022 |
$9 |
| 2021 |
$-4 |
| 2020 |
$-2 |
| 2019 |
$-5 |
| 2018 |
$1 |
| 2017 |
$-5 |
| 2016 |
$-6 |
| 2015 |
$-7 |
| 2014 |
$1 |
| 2013 |
$-3 |
| 2012 |
$-4 |
| 2011 |
$-4 |
| 2010 |
$-0 |
| 2009 |
$-25 |
Aehr Test Systems Quarterly EBITDA
(Millions of US $) |
| 2024-08-31 |
$1 |
| 2024-05-31 |
$3 |
| 2024-02-29 |
$-2 |
| 2023-11-30 |
$6 |
| 2023-08-31 |
$4 |
| 2023-05-31 |
$6 |
| 2023-02-28 |
$4 |
| 2022-11-30 |
$4 |
| 2022-08-31 |
$1 |
| 2022-05-31 |
$7 |
| 2022-02-28 |
$2 |
| 2021-11-30 |
$1 |
| 2021-08-31 |
$-1 |
| 2021-05-31 |
$1 |
| 2021-02-28 |
$-1 |
| 2020-11-30 |
$-2 |
| 2020-08-31 |
$-2 |
| 2020-05-31 |
$-3 |
| 2020-02-29 |
$0 |
| 2019-11-30 |
$0 |
| 2019-08-31 |
$-0 |
| 2019-05-31 |
$0 |
| 2019-02-28 |
$-3 |
| 2018-11-30 |
$-0 |
| 2018-08-31 |
$-1 |
| 2018-05-31 |
$0 |
| 2018-02-28 |
$0 |
| 2017-11-30 |
$0 |
| 2017-08-31 |
$0 |
| 2017-05-31 |
$-1 |
| 2017-02-28 |
$-2 |
| 2016-11-30 |
$-1 |
| 2016-08-31 |
$-0 |
| 2016-05-31 |
$-3 |
| 2016-02-29 |
$-3 |
| 2015-11-30 |
$-1 |
| 2015-08-31 |
$1 |
| 2015-05-31 |
$-2 |
| 2015-02-28 |
$-2 |
| 2014-11-30 |
$-2 |
| 2014-08-31 |
$-1 |
| 2014-05-31 |
$0 |
| 2014-02-28 |
$0 |
| 2013-11-30 |
$0 |
| 2013-08-31 |
$-0 |
| 2013-05-31 |
$-1 |
| 2013-02-28 |
$-1 |
| 2012-11-30 |
$-1 |
| 2012-08-31 |
$-0 |
| 2012-05-31 |
$-1 |
| 2012-02-29 |
$-1 |
| 2011-11-30 |
$-1 |
| 2011-08-31 |
$-1 |
| 2011-05-31 |
$-0 |
| 2011-02-28 |
$-1 |
| 2010-11-30 |
$-1 |
| 2010-08-31 |
$-1 |
| 2010-05-31 |
$-1 |
| 2010-02-28 |
$2 |
| 2009-11-30 |
$-2 |
| 2009-08-31 |
$1 |
| 2009-05-31 |
$-4 |
| 2009-02-28 |
$-24 |
| Sector |
Industry |
Market Cap |
Revenue |
| Computer and Technology |
Electrical Measuring Instruments |
$0.372B |
$0.066B |
|
Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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