Aehr Test Systems Total Liabilities 2010-2024 | AEHR
Aehr Test Systems total liabilities from 2010 to 2024. Total liabilities can be defined as the total value of all possible claims against the corporation.
Aehr Test Systems Annual Total Liabilities
(Millions of US $) |
| 2024 |
$16 |
| 2023 |
$23 |
| 2022 |
$11 |
| 2021 |
$10 |
| 2020 |
$7 |
| 2019 |
$6 |
| 2018 |
$12 |
| 2017 |
$14 |
| 2016 |
$11 |
| 2015 |
$10 |
| 2014 |
$5 |
| 2013 |
$6 |
| 2012 |
$5 |
| 2011 |
$3 |
| 2010 |
$3 |
| 2009 |
$4 |
Aehr Test Systems Quarterly Total Liabilities
(Millions of US $) |
| 2024-08-31 |
$23 |
| 2024-05-31 |
$16 |
| 2024-02-29 |
$15 |
| 2023-11-30 |
$14 |
| 2023-08-31 |
$25 |
| 2023-05-31 |
$23 |
| 2023-02-28 |
$16 |
| 2022-11-30 |
$11 |
| 2022-08-31 |
$10 |
| 2022-05-31 |
$11 |
| 2022-02-28 |
$13 |
| 2021-11-30 |
$17 |
| 2021-08-31 |
$10 |
| 2021-05-31 |
$10 |
| 2021-02-28 |
$8 |
| 2020-11-30 |
$6 |
| 2020-08-31 |
$6 |
| 2020-05-31 |
$7 |
| 2020-02-29 |
$5 |
| 2019-11-30 |
$8 |
| 2019-08-31 |
$7 |
| 2019-05-31 |
$6 |
| 2019-02-28 |
$10 |
| 2018-11-30 |
$12 |
| 2018-08-31 |
$12 |
| 2018-05-31 |
$12 |
| 2018-02-28 |
$13 |
| 2017-11-30 |
$13 |
| 2017-08-31 |
$14 |
| 2017-05-31 |
$14 |
| 2017-02-28 |
$11 |
| 2016-11-30 |
$10 |
| 2016-08-31 |
$12 |
| 2016-05-31 |
$11 |
| 2016-02-29 |
$11 |
| 2015-11-30 |
$8 |
| 2015-08-31 |
$9 |
| 2015-05-31 |
$10 |
| 2015-02-28 |
$5 |
| 2014-11-30 |
$4 |
| 2014-08-31 |
$5 |
| 2014-05-31 |
$5 |
| 2014-02-28 |
$6 |
| 2013-11-30 |
$6 |
| 2013-08-31 |
$6 |
| 2013-05-31 |
$6 |
| 2013-02-28 |
$5 |
| 2012-11-30 |
$6 |
| 2012-08-31 |
$6 |
| 2012-05-31 |
$5 |
| 2012-02-29 |
$3 |
| 2011-11-30 |
$4 |
| 2011-08-31 |
$4 |
| 2011-05-31 |
$3 |
| 2011-02-28 |
$3 |
| 2010-11-30 |
$3 |
| 2010-08-31 |
$3 |
| 2010-05-31 |
$3 |
| 2010-02-28 |
$5 |
| 2009-11-30 |
$4 |
| 2009-08-31 |
$3 |
| 2009-05-31 |
$4 |
| 2009-02-28 |
$5 |
| Sector |
Industry |
Market Cap |
Revenue |
| Computer and Technology |
Electrical Measuring Instruments |
$0.347B |
$0.066B |
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Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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