Aehr Test Systems Income After Taxes 2010-2024 | AEHR
Aehr Test Systems income after taxes from 2010 to 2024. Income after taxes can be defined as earnings or losses after income tax expense but before minority interest, extraordinary items, discontinued operations, preferred dividends and accounting changes have been accounted for.
Aehr Test Systems Annual Income After Taxes (Millions of US $) |
2024 |
$33 |
2023 |
$15 |
2022 |
$9 |
2021 |
$-2 |
2020 |
$-3 |
2019 |
$-5 |
2018 |
$1 |
2017 |
$-6 |
2016 |
$-7 |
2015 |
$-7 |
2014 |
$0 |
2013 |
$-3 |
2012 |
$-3 |
2011 |
$-3 |
2010 |
$-0 |
2009 |
$-30 |
Aehr Test Systems Quarterly Income After Taxes (Millions of US $) |
2024-08-31 |
$1 |
2024-05-31 |
$24 |
2024-02-29 |
$-1 |
2023-11-30 |
$6 |
2023-08-31 |
$5 |
2023-05-31 |
$6 |
2023-02-28 |
$4 |
2022-11-30 |
$4 |
2022-08-31 |
$1 |
2022-05-31 |
$6 |
2022-02-28 |
$2 |
2021-11-30 |
$1 |
2021-08-31 |
$1 |
2021-05-31 |
$0 |
2021-02-28 |
$-1 |
2020-11-30 |
$-2 |
2020-08-31 |
$0 |
2020-05-31 |
$-3 |
2020-02-29 |
$0 |
2019-11-30 |
$0 |
2019-08-31 |
$-0 |
2019-05-31 |
$0 |
2019-02-28 |
$-3 |
2018-11-30 |
$-1 |
2018-08-31 |
$-2 |
2018-05-31 |
$0 |
2018-02-28 |
$0 |
2017-11-30 |
$0 |
2017-08-31 |
|
2017-05-31 |
$-1 |
2017-02-28 |
$-3 |
2016-11-30 |
$-1 |
2016-08-31 |
$-1 |
2016-05-31 |
$-3 |
2016-02-29 |
$-3 |
2015-11-30 |
$-1 |
2015-08-31 |
$0 |
2015-05-31 |
$-2 |
2015-02-28 |
$-2 |
2014-11-30 |
$-2 |
2014-08-31 |
$-1 |
2014-05-31 |
$0 |
2014-02-28 |
$0 |
2013-11-30 |
$0 |
2013-08-31 |
$-0 |
2013-05-31 |
$-1 |
2013-02-28 |
$-1 |
2012-11-30 |
$-1 |
2012-08-31 |
$-0 |
2012-05-31 |
$-1 |
2012-02-29 |
$-1 |
2011-11-30 |
$-1 |
2011-08-31 |
$0 |
2011-05-31 |
$-0 |
2011-02-28 |
$-1 |
2010-11-30 |
$-1 |
2010-08-31 |
$-2 |
2010-05-31 |
$-1 |
2010-02-28 |
$2 |
2009-11-30 |
$-2 |
2009-08-31 |
$1 |
2009-05-31 |
$-4 |
2009-02-28 |
$-28 |
Sector |
Industry |
Market Cap |
Revenue |
Computer and Technology |
Electrical Measuring Instruments |
$0.360B |
$0.066B |
Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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