Aehr Test Systems Other Non-Current Liabilities 2010-2024 | AEHR
Aehr Test Systems other non-current liabilities from 2010 to 2024. Other non-current liabilities can be defined as field containing the sum of all non-current liabilities that cannot be standardized into another field as well as those that are aggregated by the company because materially, they are too small to list separately.
Aehr Test Systems Annual Other Non-Current Liabilities (Millions of US $) |
2024 |
$0 |
2023 |
$0 |
2022 |
$0 |
2021 |
$0 |
2020 |
$ |
2019 |
$0 |
2018 |
$0 |
2017 |
$ |
2016 |
$ |
2015 |
$0 |
2014 |
$0 |
2013 |
$0 |
2012 |
$0 |
2011 |
$0 |
2010 |
$0 |
2009 |
$0 |
Aehr Test Systems Quarterly Other Non-Current Liabilities (Millions of US $) |
2024-08-31 |
$2 |
2024-05-31 |
$0 |
2024-02-29 |
$0 |
2023-11-30 |
$0 |
2023-08-31 |
$0 |
2023-05-31 |
$0 |
2023-02-28 |
$0 |
2022-11-30 |
$0 |
2022-08-31 |
$0 |
2022-05-31 |
$0 |
2022-02-28 |
$0 |
2021-11-30 |
$0 |
2021-08-31 |
$0 |
2021-05-31 |
$0 |
2021-02-28 |
$0 |
2020-11-30 |
|
2020-08-31 |
|
2020-05-31 |
|
2020-02-29 |
|
2019-11-30 |
|
2019-08-31 |
|
2019-05-31 |
$0 |
2019-02-28 |
$0 |
2018-11-30 |
$0 |
2018-08-31 |
|
2018-05-31 |
$0 |
2018-02-28 |
|
2017-11-30 |
|
2017-08-31 |
|
2017-05-31 |
|
2017-02-28 |
|
2016-11-30 |
|
2016-08-31 |
|
2016-05-31 |
|
2016-02-29 |
|
2015-11-30 |
|
2015-08-31 |
|
2015-05-31 |
$0 |
2015-02-28 |
$0 |
2014-11-30 |
$0 |
2014-08-31 |
$0 |
2014-05-31 |
$0 |
2014-02-28 |
$0 |
2013-11-30 |
$0 |
2013-08-31 |
$0 |
2013-05-31 |
$0 |
2013-02-28 |
$0 |
2012-11-30 |
$0 |
2012-08-31 |
$0 |
2012-05-31 |
$0 |
2012-02-29 |
$0 |
2011-11-30 |
$0 |
2011-08-31 |
$0 |
2011-05-31 |
$0 |
2011-02-28 |
$0 |
2010-11-30 |
$0 |
2010-08-31 |
$0 |
2010-05-31 |
$0 |
2010-02-28 |
$0 |
2009-11-30 |
$0 |
2009-08-31 |
$0 |
2009-05-31 |
$0 |
2009-02-28 |
$0 |
Sector |
Industry |
Market Cap |
Revenue |
Computer and Technology |
Electrical Measuring Instruments |
$0.372B |
$0.066B |
Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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