Aehr Test Systems Research and Development Expenses 2010-2024 | AEHR
Aehr Test Systems research and development expenses from 2010 to 2024. Research and development expenses can be defined as an expense arising from studies and product development processes.
Aehr Test Systems Annual Research and Development Expenses
(Millions of US $) |
| 2024 |
$9 |
| 2023 |
$7 |
| 2022 |
$6 |
| 2021 |
$4 |
| 2020 |
$3 |
| 2019 |
$4 |
| 2018 |
$4 |
| 2017 |
$5 |
| 2016 |
$4 |
| 2015 |
$4 |
| 2014 |
$3 |
| 2013 |
$3 |
| 2012 |
$4 |
| 2011 |
$5 |
| 2010 |
$5 |
| 2009 |
$6 |
Aehr Test Systems Quarterly Research and Development Expenses
(Millions of US $) |
| 2024-08-31 |
$2 |
| 2024-05-31 |
$2 |
| 2024-02-29 |
$2 |
| 2023-11-30 |
$2 |
| 2023-08-31 |
$2 |
| 2023-05-31 |
$2 |
| 2023-02-28 |
$2 |
| 2022-11-30 |
$2 |
| 2022-08-31 |
$1 |
| 2022-05-31 |
$2 |
| 2022-02-28 |
$2 |
| 2021-11-30 |
$1 |
| 2021-08-31 |
$1 |
| 2021-05-31 |
$1 |
| 2021-02-28 |
$1 |
| 2020-11-30 |
$1 |
| 2020-08-31 |
$1 |
| 2020-05-31 |
$1 |
| 2020-02-29 |
$1 |
| 2019-11-30 |
$1 |
| 2019-08-31 |
$1 |
| 2019-05-31 |
$1 |
| 2019-02-28 |
$1 |
| 2018-11-30 |
$1 |
| 2018-08-31 |
$1 |
| 2018-05-31 |
$1 |
| 2018-02-28 |
$1 |
| 2017-11-30 |
$1 |
| 2017-08-31 |
$1 |
| 2017-05-31 |
$1 |
| 2017-02-28 |
$1 |
| 2016-11-30 |
$1 |
| 2016-08-31 |
$1 |
| 2016-05-31 |
$1 |
| 2016-02-29 |
$1 |
| 2015-11-30 |
$1 |
| 2015-08-31 |
$1 |
| 2015-05-31 |
$1 |
| 2015-02-28 |
$1 |
| 2014-11-30 |
$1 |
| 2014-08-31 |
$1 |
| 2014-05-31 |
$1 |
| 2014-02-28 |
$1 |
| 2013-11-30 |
$1 |
| 2013-08-31 |
$1 |
| 2013-05-31 |
$1 |
| 2013-02-28 |
$1 |
| 2012-11-30 |
$1 |
| 2012-08-31 |
$1 |
| 2012-05-31 |
$1 |
| 2012-02-29 |
$1 |
| 2011-11-30 |
$1 |
| 2011-08-31 |
$1 |
| 2011-05-31 |
$1 |
| 2011-02-28 |
$1 |
| 2010-11-30 |
$1 |
| 2010-08-31 |
$1 |
| 2010-05-31 |
$1 |
| 2010-02-28 |
$1 |
| 2009-11-30 |
$1 |
| 2009-08-31 |
$1 |
| 2009-05-31 |
$1 |
| 2009-02-28 |
$2 |
| Sector |
Industry |
Market Cap |
Revenue |
| Computer and Technology |
Electrical Measuring Instruments |
$0.356B |
$0.066B |
|
Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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