Aehr Test Systems Total Non-Operating Income/Expense 2010-2024 | AEHR
Aehr Test Systems total non-operating income/expense from 2010 to 2024. Total non-operating income/expense can be defined as the sum of all non-operating expenses for the given industry.
Aehr Test Systems Annual Total Non-Operating Income/Expense (Millions of US $) |
2024 |
$2 |
2023 |
$1 |
2022 |
$2 |
2021 |
$2 |
2020 |
$-0 |
2019 |
$-0 |
2018 |
$-0 |
2017 |
$-1 |
2016 |
$-1 |
2015 |
$0 |
2014 |
$-0 |
2013 |
$-0 |
2012 |
$1 |
2011 |
$1 |
2010 |
$0 |
2009 |
$0 |
Aehr Test Systems Quarterly Total Non-Operating Income/Expense (Millions of US $) |
2024-08-31 |
$1 |
2024-05-31 |
$1 |
2024-02-29 |
$1 |
2023-11-30 |
$1 |
2023-08-31 |
$1 |
2023-05-31 |
$0 |
2023-02-28 |
$0 |
2022-11-30 |
$0 |
2022-08-31 |
$0 |
2022-05-31 |
$-0 |
2022-02-28 |
$0 |
2021-11-30 |
$0 |
2021-08-31 |
$2 |
2021-05-31 |
$-0 |
2021-02-28 |
$-0 |
2020-11-30 |
$-0 |
2020-08-31 |
$2 |
2020-05-31 |
$-0 |
2020-02-29 |
$0 |
2019-11-30 |
$0 |
2019-08-31 |
$0 |
2019-05-31 |
$-0 |
2019-02-28 |
$-0 |
2018-11-30 |
$-0 |
2018-08-31 |
$-0 |
2018-05-31 |
$-0 |
2018-02-28 |
$-0 |
2017-11-30 |
$-0 |
2017-08-31 |
$-0 |
2017-05-31 |
$-0 |
2017-02-28 |
$-0 |
2016-11-30 |
$-0 |
2016-08-31 |
$-0 |
2016-05-31 |
$-0 |
2016-02-29 |
$-0 |
2015-11-30 |
$-0 |
2015-08-31 |
$-0 |
2015-05-31 |
$-0 |
2015-02-28 |
$0 |
2014-11-30 |
$0 |
2014-08-31 |
$0 |
2014-05-31 |
$0 |
2014-02-28 |
$-0 |
2013-11-30 |
$-0 |
2013-08-31 |
$-0 |
2013-05-31 |
$0 |
2013-02-28 |
$-0 |
2012-11-30 |
$-0 |
2012-08-31 |
$-0 |
2012-05-31 |
$0 |
2012-02-29 |
$0 |
2011-11-30 |
$0 |
2011-08-31 |
$1 |
2011-05-31 |
$0 |
2011-02-28 |
$-0 |
2010-11-30 |
$1 |
2010-08-31 |
$0 |
2010-05-31 |
$0 |
2010-02-28 |
$0 |
2009-11-30 |
$0 |
2009-08-31 |
$-0 |
2009-05-31 |
$-0 |
2009-02-28 |
$0 |
Sector |
Industry |
Market Cap |
Revenue |
Computer and Technology |
Electrical Measuring Instruments |
$0.372B |
$0.066B |
Aehr Test Systems develops, manufactures and sells systems which aredesigned to reduce the cost of testing DRAMs and other memory devices, perform reliability screening or burn-in of complex logic and memory devices, and enable IC manufacturers to perform test and burn-in of bare die. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,000 systems installed worldwide, the Company has developed and introduced two innovative product families, the MTX system and the DiePak-Registered Trademark- carrier.
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